barcodefield.com

Cause effect diagnosis in Java Assign bar code 39 in Java Cause effect diagnosis




How to generate, print barcode using .NET, Java sdk library control with example project source code free download:
10.4 Cause effect diagnosis use jdk barcode code39 implementation topaint code 3/9 on java Barcodes for Mobile Applications dictionary Code-39 for Java representation is used, the error response for the dependent fault obtained in this manner is referred to as approximate error response. Let us consider two speci c examples of such a diagnosis scenario. As the rst scenario, consider a case where the single SAF model is used to generate the dictionary, but each likely defect is assumed to behave either as a single SAF or a TF.

As the second scenario, consider a case where the single SAF model is used to generate the dictionary, but each likely defect is assumed to behave either as a single SAF or a two-line NFBF. TFs as dependent faults on single SAFs: As described in Section 10.3 and Table 10.

4, the error response for the SA0 fault at line b covers the error response of fault b E b STR . Due to the above relationship, it is possible to use a fault STR, i.e.

, E b SA0 dictionary created for single SAFs to diagnose circuits where a defect may be assumed to behave as a single SAF or a TF. In such a scenario, rst the dictionary created for single SAFs is augmented to include an entry for each TF. Then the manner in which the dictionary is used is modi ed.

First, consider the case where a complete fault dictionary for single SAFs is provided. In the light of the above relationship between the conditions for detection of an SAF and the corresponding TF, the error response associated with an SA0 (SA1) fault on line b is now also associated with the STR (STF) fault at b. The matching criterion is then speci ed as described next to take into account that, depending on the value implied at line b by the previous vector in the test sequence, a vector that detects an SA0 fault at line b may or may not detect the STR fault at that line.

Under the new matching criteria, any TF whose approximate error response covers the error response of the CUT is declared as a possible fault within the CUT. Furthermore, any SAF whose error response matches that of the CUT is also declared as a possible fault. A eld can be added to each row of the dictionary to indicate the matching criterion used for the corresponding fault(s).

Next, consider a scenario where a pass fail dictionary is provided for single SAFs. In this case, a new entry is created for an STR fault at a line b by using the pass fail information for b SA0 fault. Similarly, an entry is created for each STF fault.

An SAF is declared as a possible fault if the corresponding failing vectors match those of the CUT. In contrast, a TF is declared as a possible fault if the corresponding approximate failing vectors cover those of the CUT. Example 10.

20 Consider the circuit and the sequence of test vectors shown in Figure 10.1 once again. First, the single SAF dictionary shown in Table 10.

5 is modi ed to list each TF. In addition, each entry of the table is augmented with the corresponding matching criterion. For each entry corresponding to an SAF, the criterion is match ; for each entry corresponding to a TF, the criterion is cover .

The dictionary obtained in this manner is shown in Table 10.12..

Fault diag nosis Table 10.12. A fault dictionary for SAFs and TFs for the circuit and vectors in Figure 10.

1, derived from the SAF dictionary in Table 10.5 Fault Comparison criterion Match Match Match Match Match Match Match Match Match Match Match Match Match Match Cover Cover Cover Cover Cover Cover Cover Cover Cover Cover Cover Cover Cover Cover Error for vector Pi at output zl P1 P2 P3 P4 z1 z2 z1 z2 z1 z2 z1 z2. x1 SA0 c1 tomcat 3 of 9 SA0 z 1 SA1 x1 SA1 x2 SA0 x2 SA1 x3 SA0 c2 SA0 z 2 SA1 x3 SA1 c1 SA1 c2 SA1 z 1 SA0 z 2 SA0 x1 STR c1 STR z 1 STF x1 STF x2 STR x2 STF x3 STR c2 STR z 2 STF x3 STF c1 STF c2 STF z 1 STR z 2 STR. 1 1 1 1 1 1. 1 1 1 1 1 1 1 1 1 1. 1 1 1 1 1 1. 1 1 1 1 1 1 1 1 1 1. Note that the changes to the dictionary are so systematic that it is really not necessary to explicitly change the dictionary. Typically, to save storage space, the program that matches the CUT error responses to dictionary entries is altered to take into account such changes, while working off the single SAF dictionary. Example 10.

21 Assume that error response E for a given CUT for the circuit considered in the above example is ((0, 0), (0, 0), (0, 1), (0, 0)). This is compared with each row in Table 10.12; for each row marked match a match is sought, and for each row marked cover a cover is sought.

Faults x3 STF and z 2 STR are declared.
Copyright © barcodefield.com . All rights reserved.